Microscopia de Varredura por Força: uma Ferramenta Poderosa no Estudo de Polímeros
Herrmann, Paulo S. P.; Silva, Marcelo A. P. da; Bernardes Filho, Rubens; Job, Aldo E.; Colnago, Luiz A.; Frommer, Jane E.; Mattoso, Luiz H. C.
http://dx.doi.org/10.1590/S0104-14281997000400009
Polímeros: Ciência e Tecnologia, vol.7, n4, p.51-61, 1997
Resumo
As técnicas de microscopia de varredura por força tem promovido um grande impacto em ciência dos materiais devido a possibilidade de obtenção de imagens em escala que pode chegar no nível atômico. Neste trabalho serão apresentados o princípio básico de funcionamento da microscopia de varredura por força, os vários modos de operação e as forças envolvidas e medidas. O potencial de aplicação destas técnicas no estudo de materiais, e em particular de polímeros, serão discutidos. Uma comparação da microscopia de força atômica com outras técnicas de microscopia será apresentada, assim como exemplos da utilização da técnica de microscopia de força atômica para o estudo de polímeros.
Palavras-chave
Microscopia de varredura por força, morfologia, estrutura, polímeros
References
1. Binnig, G.; Rohrer, H.; Gerber, Ch.; Weibel, E. Surfaces studies by scanning tunneling microscopy. Phys. Rev. Let., v.49, n.1, p.57-61, (1982).
2. Binnig, G.; Quate, C.F.; Gerber, Ch. Atomic force microscope. Phys. Rev. Let., v.56, n.9, p.930-933, (1986).
3. Bottomley, L.A.; Coury, J.E.; First, P.N.; Scann. Probe Microsc. Analyt. Chem. v.68, p.185R-230R, n.12, (1996).
4. Meyer, E.; Atomic force microscopy. Prog. in Surf. Sci. v.41, p.3-49, (1992).
5. Digital Instruments, NanoScope Command Reference Manual, Santa Barbara - CA.
6. Park Scientific Instruments, A practical guide to scanning probe microscopy, p. 74 (1996).
7. Israelachivili, J.; Intermol. and Surf. Forces, Academic Press, San Diego, CA, p.312, (1992).
8. Wiesendanger, R.; Scanning Probe Microscopy and Spectroscopy. Cambridge University Press, Cambridge, (1994).
9. Frommer, J.; Scanning probe microscopy of organics, an update. Thin Solids Films. v.273, p.112-115, (1996).
10. Binning, G.; Fuchs, H.; Gerber, Ch.; Rohrer, H.; Stoli, E.; Tosatti, E.; Europhys. Lett. v.1, p.31, (1986).
11. Binggeli, M.; Mate, C.M.; Influence of water vapor on nanotribology studied by friction force microscopy. J.Vac.Sci.Technol.B, v.13, n.3, p.1312-1315, (1995).
12. Overney, R.; Meyer, E.; Tribological investigations using friction force microscopy. MRS Bull., p.26-34, (1993).
13. Bhushan, B.; ed. Handbook of Micro/Nanotribology. CRC Publishers, Boca Raton, FL, (1995).
14. Frommer, J.; Scanning tunneling microscopy and atomic force microscopy in Organic chemistry. Angew. Chem. Int. Ed. Engl., v.31, p.1298-1328, (1992).
15. Bhushan, B.; Koinkar, V.N.; Microtribology of Pet Polymeric Films, Tribol. Trans., Vol 38, n. 1, pp 119-127, (1995).
16. Mosleh, M. Suh, N.P., Wear Particles of Polyethylene in Biological-Systems, Tribol. Trans., Vol 39, n. 4, pp 843-848, (1996).
17. Vancso, G.J.; Allston, T.D.; Chun, I.; Johansson, L.S.; Liu, G.B.; Smith, P.F.; Surface-Morphology of Polymer-Films Imaged by Atomic-Force Microscopy, Int. J. of Polym. Anal. and Characteriz., Vol 3, n. 1, pp 89-105, (1996).
18. Vandenberg, R.; Schulze, D.; Boltwesterhoff, J.a.; Dejong, F.; Reinhoudt, D.N.; Velinova, D.; Buitenhuis, L.; Influence of Membrane Microstructure on the Diffusion Barrier of Supported Liquid-Crystalline Membranes, J. of Phys. Chem., Vol 99, n. 19, pp 7760-7765, (1995).
19. Tsukruk, V.V.; Reneker, D.H.; Surface-Morphology of Syndiotactic Polypropylene Single-Crystals Observed by Atomic-Force Microscopy, Macromolecules, Vol 28, n. 5, pp 1370-1376, (1995).
20. Katzenberg, F.; Loos, J.; Petermann, J.; Mcmaster, T.; Miles, M.; A Cross-Sectional Preparation Method for TEM and AFM Investigations on Layered Polymer Interfaces, Polym. Bull., Vol 35, n. 1-2, pp 195-200, (1995).
21. Qian, R.Y.; Shen, J.S.; Bei, N.J.; Bai, C.L.; Zhu, C. F.; Wang, X.W.; Morphological Observations of Single-Chain Glassy Polystyrene by Means of Tapping Mode Atomic-Force Microscopy, Macromol. Chem. and Phys., Vol 197, n. 7, pp 2165-2174, (1996).
22. Nie, H.Y.; Motomatsu, M.; Mizutani, W.; Tokumoto, H.; Local Elasticity Measurement on Polymers Using Atomic-Force Microscopy, Thin Solid Films, Vol 273, n. 1-2, pp 143-148, (1996).
23. Goudy, A.; Gee, M.L.; Biggs, S.; Underwood, S.; Atomic-Force Microscopy Study of Polystyrene Latex Film Morphology - Effects of Aging and Annealing, Langmuir, Vol 11, n. 11, pp 4454-4459, (1995).
24. Anczykowski, B.; Chi, L.F.; Fuchs, H.; Atomic-Force Microscopy Investigations on Polymer Latex Films, Surf. and Interf. Anal., Vol 23, n. 6, pp 416-425, (1995).
25. Vandijk, M.A.; Vandenborg, R.; Ordering Phenomena in Thin Block-Copolymer Films Studied Using Atomic-Force Microscopy, Macromolecules, Vol 28, n. 20, pp 6773-6778, (1995)
26. Albrecht, T. R.; Advances in Atomic Force Microscopy and Scanning Tunneling Microscopy. Stanford: Stanford University,. PhD Thesis, (1989).
27. Thomson, N. H.; Fritz, M.; Radmacher, M.; Cleveland, J. P.; Schmidt, Ch. F.; Hansma, P. K.; Protein Tracking and Detection of Protein Motion using Atomic Force Microscopy. Biophys. J., Vol. 70, pp. 2421-2431, (1996).
28. Herrmann, P.S.P.; Mattoso, L.H.C.; Frommer, J.E.; Colnago, L.A.; Uso da Microscopia de Força Atômica para Estudos de Morfologia de Fibra Vegetal. In: Simpósio Nacional de Instrumentação Agropecuária, 1., São Carlos-SP, nov. 1996 Anais... São Carlos: EMBRAPA-CNPDIA, 1996. (no prelo).
29. Riul J.R.; A.; Mattoso, L.H.C.; Telles, G.D.; Herrmann, P.S.P.; Colnago, L.A.; Parizotto, N.A.; Baranauska, V.; Faria, R.M.; Oliveira Jr. O.N.; Characterization of Langmuir-Blodgett films of parent polyaniline. Thin Solid Films, v. 284-285, p.177-180, (1996).
30. Magonov, S.N.; Whangbo, M.H.; Polymers, Chap 13, In: Surface Analysis with STM and AFM, VCH pub, Fed. Repub. Germany, Weinhem, p. 277, (1996).
31. Xu, M.X.; Liu, W.G.; Wang, C.L.; Gao, Z. X.; Yao, K.D.; Surface Crystalline Characteristics of Polyurethane Investigated by Atomic-Force Microscopy, J. of Appl. Polym. Sci. Vol 61, p.2225-2228 (l996).
32. Lian,Y.; Leu, K. W.; Liao, S. L.; Tsai, V. M.; Effects of Surface Treatments and Deposition Conditions on the Adhesion of Silicon Dioxide Thin-Filn on Polyrnethylmethacrylate, Surface & Coatings Technology, vol 71, Iss 2, pp 142-150, (1995).
33. Brocherieux A.; Dessaux O.; Goudmand P.; Gebgembre L.; Brunel M.; Lazzaroni R.; Characterization of Nickel Films Deposited by Cold Remote Nitrogen Plasma on Acrylonitrile-butadiene-styrene Copolymer, Applied Surface Science vol 90, lss i, pp 47-58, (1995).
34. Baty, A. M.; Suci, P. A.; Tyler, B. J; Geesey, G. G.; Investigation of Mussel Adhesive Protein Adsorption on Polystyrene and Poly(Octadecyl Methacrylate) Using Angle Dependent XPS, ATR-FTIR and AFM, J. of Colloid and Interface Science, vol 177, lss 2, pp 307-315, (1996).
35. Bu, Z.Z.; Yoon, Y.; Ho, R. M.; Zhou, W.S.; Jangchud, I.; Eby, R.K.; Cheng, S.Z.D.; Hsieh, E.T.; Johnson, T.W.; Geerts, R.G.; Palackal, S.J.; Hawley, G.R.; Welch, M.B.; Crystallization, Melting, and Morphology of Syndiotactic Polypropylene Fractions .3. Lamellar Single-Crystals and Chain Folding, Macromolecules, vol 29, lss 20, pp 6575-6581, (1996).
36. Schonherr, H.; Vancso, G.B.; Argon, A.S.; The Structure of Highly Textured Quasi-Single-Crystalhne High-Density Polyethylene Probed by Atomic-Force Microscopy and Small-Angle X-Ray-Scattering, Polymer, vol 36, iss i i, pp 2115-2121, (1995).
37. Herrmann, P.S.P.; Colnago, L.A.; Mattoso, L.H.C.; Cruvinel, P.E.; Frommer, J.E. Analysis of spatial variability of lyosozyme thin film by AFM. In: -P gengemibre-l, Meeting of the Brazilian Society for Electron Microscopy, 16., 1997, Caxambu, MG. Acta Microscopica, v.6, suppl. A, p. 290-291, (1997).